A comprehensive data-analysis package designed to fully analyse reflectance data recorded on any good interferometer; whether commercial or home-built.
R-Fit© V4 can analyse data recorded at any wavelength, at any angle of incidence and can also cope with any number of individual layers.
R-Fit© V4 gives you the power to analyse your deposition like no other available software solutions. Requiring an initial deposition of around, a tiny, 20Å (example based on GaN on Al2O3) R-Fit©V4 is capable of providing useful information such as the complex refractive index, growth rate, RMS roughness and layer thickness. No other commercially available software packages can even come close!
This comprehensive tool presents you with useful information in just minutes, rather than tables and tables of data which then require hours of analysis. The beauty of R-Fit© V4 is its simplicity – you do not need to spend weeks training to learn how to operate it. R-Fit© V4 is so flexible it can analyse any number of layers, materials and substrates. R-Fit© V4 also provides the modelling solution for our flagship R-Fit© LIVE!
R-Fit© V4 is the must have for anyone who is serious about in situ metrology.
- Downloads
- Download R-FIT V4 information and specifications (PDF 216K)
- Download our corporate brochure here: (PDF 496K)
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E-mail: enquiry@ors-ltd.com