News
YSystems Ltd. of Japan has chosen to integrate ORS's EpiEYE's technology as a key component of their growth monitoring systems. Dr. Yves Lacroix, owner of YSystems, chose ORS because "The EpiEYE in-situ laser tool implements our fundamental product philosophy which is simplicity and reliability in hardware combined with flexibility with know-how in software control and analysis. I believe it can provide state-of-the-art digital accuracy in the analog world of growth monitoring. www.ysystems.jp
The ORS EpiEYE is a mature, versatile in situ metrology solution instantly applicable into MOVPE production systems. Having an EpiEYE on our reactor, with the customized MCT software package, greatly assists us in the efficient growth of HgCdTe heterostructures for both production and R&D. The implementation of this in situ monitoring technique gives us unique and most useful insight into the epitaxial growth process. The ORS solutions has, continues to, provide significant progress towards improving both the quality and reproducibility of our HgCdTe structures. I would have no reservations to recommend the ORS solutions to anyone who wants to increase productivity and quality of their epitaxial materials – Krzysztof Kłos, VIGO System S.A. www.vigo.com.pl
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Worldwide Agencies:
ORS anounce worldwide agency network
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- Latest news
Y-Systems chooses ORS Ltd- Vigo Systems get great results from ORS II/VI solution
- Worldwide agencies:
ORS anounce worldwide agency network
- Conferences
- Semicon Taiwan 2010, September 8-10 2010, Taipei World Trade Center, Taipei, Taiwan
- You're invited to visit Optical Reference Systems at Semicon Taiwan 2010 at the Taipei World Trade Center in Taipei, Taiwan. We are located in the South Hall at Booth # 2929
- Click Here for the Floorplan
- Latest products
- EpiREF: Easy to install , laser based in situ reflectance monitor
- EpiEYE: Combines the laser based reflectance of the EpiREF with temperature measurement
- EpiEYE Blue: All the features of the EpiEYE with additional measurements at 405nm
- ORS ARC: A single beam in situ wafer bow measurement tool
- R-Fit Live: Increases reactor up-time and wafer yield
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E-mail: enquiry@ors-ltd.com