ORS Ltd provide the most versatile in situ metrology solutions available.
Our unique hardware and software packages provide the most accurate, stable and cost effective metrology solutions for any type of thin-film deposition systems including; MOCVD, MBE, CVD, ALD, PLD, Optical Thin Films and even “home-builds” Whether you are in R&D or Production, ORS has a solution for your system.
Our ability to provide in situ monitoring solutions with just 2.5mm of optical access and an initial deposition of 20Å to provide growth rate, makes ORS stand out from the crowd.
Our ability to fully customise our solutions also provides you with the solution you need, providing you with a distinct advantage over your competitors.
Choose the smart option – choose ORS. And take control.
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- Latest news
- Worldwide agencies:
ORS anounce worldwide agency network
- Conferences
- 2008 - Sheffield 2/3 July
- ORS Prize Draw Winner:
Iain Crowe (Manchester)
- Latest products
- UniEYE: The most versatile in situ reflectance monitoring system
- R-Fit Live: Increases reactor up-time and wafer yield
- Download our brochure here: (PDF 496K)
- Get Adobe Reader here
E-mail: enquiry@ors-ltd.com