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ORS - Optical Reference Systems - Thin film monitoring

ORS Ltd provide the most versatile in situ metrology solutions available.

Our unique hardware and software packages provide the most accurate, stable and cost effective metrology solutions for any type of thin-film deposition systems including; MOCVD, MBE, CVD, ALD, PLD, Optical Thin Films and even “home-builds” Whether you are in R&D or Production, ORS has a solution for your system.

Our ability to provide in situ monitoring solutions with just 2.5mm of optical access and an initial deposition of 20Å to provide growth rate, makes ORS stand out from the crowd.

Laser based technology and a total packaged solution means that you are able to install the system yourself, saving you "thousands" in unnecessary expenses. The fact that no focusing is required, enables you to move the tool from one machine to another quickly and easily even across different reactor types.

ORS' pricing structure and in-house manufacturing means that we are able to offer the most affordale solutions available

Our ability to fully customise our solutions also provides you with the solution you need, providing you with a distinct advantage over your competitors.

Choose the smart option – choose ORS. And take control.

 

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Should you need further information, please contact us: Tel: +44 (0)1745 535188
E-mail: enquiry@ors-ltd.com
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